4.6 Article

Electrical investigation of sprayed In2S3 film

期刊

出版社

ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2020.105294

关键词

In2S3; Thin films; Spray pyrolysis; XRD; Raman; Electrical properties

资金

  1. Tunisian Ministry of Higher Education and Scientific Research
  2. Spanish Ministry of Science and Innovation-FEDER Funds (MODENA Project) [CTQ2016-79461-R]
  3. Fundaci.on Ramon Areces (Spain) [CIVP18A3940]
  4. FEDER [ED431C-2017/22]
  5. AEMAT Strategic Partnership (Xunta de Galicia, Spain) [ED431C-2017/22, ED431E-2018/08]

向作者/读者索取更多资源

In2S3 thin film was successfully deposited by spray pyrolysis at 340 degrees C, showing polycrystalline structure with grains of different sizes on a continuous surface. Electrical properties of the film indicate increasing conductance with temperature, with conduction mechanism explained by correlated barrier hopping model. The equivalent circuit for In2S3 film includes R and CPE connected in parallel.
Indium sulfide thin film has been deposited by spray pyrolysis technique at 340 degrees C. Structural analysis by XRD and Raman analysis confirm that this sample is polycrystalline, belongs to the beta cubic phase and has no sec-ondary phases. The crystallite size is around 32 nm. Morphological study shows that the surface is entirely protected with grains of different sizes and have continuous surface. Electrical properties of In2S3 thin film show that the conductance increases with increasing measurement temperature. The film conduction mechanism can be explained in terms of correlated barrier hopping (CBH) model. Activation energies deduced from relaxation time and conductance is very close which indicate that the relaxation and electrical conduction processes are related to the same origin. Nyquist diagram shows the appearance of semicircles whose radius R (R: resistance) decreases with the increase of temperature. The obtained In2S3 equivalent circuit consisted of R and CPE connected in parallel one to another.

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