期刊
MATERIALS LETTERS
卷 282, 期 -, 页码 -出版社
ELSEVIER
DOI: 10.1016/j.matlet.2020.128694
关键词
Radiation damage; Recrystallization; Microstructure; In-situ Transmission Electron Microscopy; Electrical wind force; Shockley partial dislocations
资金
- National Science Foundation [CMMI 1760931]
- U.S. Department of Energy's National Nuclear Security Administration [DE-NA-0003525]
The study explores the interaction of electron wind force with defects from ion irradiation in-situ within a transmission electron microscope. It was found that the electron wind force can significantly enhance defect mobility even at low temperatures, leading to defect migration and elimination within a few minutes. This interaction creates highly glissile Shockley partial dislocations, enabling fast and low temperature defect annihilation.
In this study, we explore the interaction of electron wind force (EWF) with defects originating from ion irradiation in-situ inside a transmission electron microscope. Nanocrystalline gold specimens were self-ion irradiated to a dose of 5 x 10(15) ions/cm(2) (45 displacement per atom) to generate a high density of displacement damage. We also developed a molecular dynamics simulation model to understand the associated atomic scale mechanisms. Both experiments and simulations show that the EWF can impart significant defect mobility even at low temperatures, resulting in the migration and elimination of defects in a few minutes. We propose that the EWF interacts with defects to create highly glissile Shockley partial dislocations, which makes the fast and low temperature defect annihilation possible. (C) 2020 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据