Transported properties and low-temperature magnetic behaviors of TixCr1-xO2 films

Electronic transport and magnetic properties of TixCr1-xO2 epitaxial films with low Ti concentrations have been studied. Compared with pure CrO2 film, Ti-doped films exhibit a significant increase of resistivity and the magnetoresistance at low temperature is more difficult to saturate even under an external field of 5 Tesla. The DC magnetization and AC susceptibility measurements suggest that a cluster glass freezing behavior occurs at low temperature in Ti-doped films. After analyzing the AC susceptibility using dynamic scaling theory, we have obtained the cluster-glass transition temperature T-G = 97.8 K, the dynamic exponent zv = 12.37, and the characteristic timescale tau(0) = 10(-16), which lies in the range of conventional cluster glass systems.

Automated summary

The electronic transport and magnetic properties of TixCr1-xO2 epitaxial films with low Ti concentrations were studied. Ti-doped films showed a significant increase in resistivity compared to pure CrO2 films, and the magnetoresistance at low temperature was more difficult to saturate even under an external field of 5 Tesla. The study also found cluster glass freezing behavior occurring at low temperature in Ti-doped films, with specific parameters obtained through analysis using dynamic scaling theory.