期刊
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
卷 69, 期 1, 页码 179-188出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMTT.2020.3020639
关键词
Microwave measurement; Loss measurement; Microwave theory and techniques; Extraterrestrial measurements; Polarization; Calibration; Microwave components; microwave measurement techniques; septum-polarizers (SPs); waveguide devices
资金
- Spanish Ministry of Science, Innovation and Universities [TEC2017-83343-C4-1-R]
- FEDER funds from the EU
This article introduces an easy and accurate technique for the full characterization of septum polarizers in back-to-back configuration through standard amplitude/power measurements at the rectangular waveguide ports. The methodology has been successfully validated for two different designs at Ku-band.
This article introduces an easy and accurate technique for the full characterization of septum polarizers (SPs) in back-to-back configuration through standard amplitude/power measurements at the rectangular waveguide ports. The proposed calibration algorithm, based on the use of two simple waveguide sections, along with the developed mathematical formulation, allows the complete extraction of the relevant SP parameters: return loss, isolation, cross-coupling (XP) or axial ratio (AR), and copolarization losses (CP). The methodology has been successfully validated for two different designs at Ku-band.
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