期刊
APPLIED SURFACE SCIENCE
卷 536, 期 -, 页码 -出版社
ELSEVIER
DOI: 10.1016/j.apsusc.2020.147873
关键词
Electrochromism; Tungsten oxide; Vanadium; Magnetron sputtering; Electrochemical properties; Chronoamperometry
类别
资金
- National Natural Science Foundation of China [U1802256, 51672128, 21773118, 21875107]
- Key Research and Development Program in Jiangsu Province [BE2018122]
- Fundamental Research Foundation of NUAA [3082017NC2017005, 3082018NP2018463]
- Priority Academic Program Development of Jiangsu Higher Education Institutions (PAPD)
This research evaluated tungsten and vanadium oxide co-sputtered thin films under different applied cyclic voltages, revealing the appearance of new peaks and severely damaged morphologies after -1.3 V cycles. The current density reduction was significant for both bleaching and coloring, with the switching times of WO3-V2O5 thin films drastically reduced compared to WO3 films.
In this research, tungsten and vanadium oxide co-sputtered thin films are evaluated for electrochromic properties based on the effects of applied cyclic voltages of -0.7 V, -1.0 V and -1.3 V for 9600 s. XRD patterns reveal the appearance of new peaks after completion of -1.3 V cycles, these peaks are not seen after lower voltage scans. SEM images also verify severely damaged morphologies. Chronoamperometry (CA) scan of -1.3 V shows a drastic reduction in current density value to as low as 32% for bleaching and 26% for coloring respectively. This is because of the lesser intercalation and de-intercalation as a result of damaged and disturbed orientation. Whereas the films with -1.0 V testing cycles shows the current density drop to 93% and 88% for bleaching and coloring respectively. A remarkable discovery in switching times of WO3-V2O5 co-sputtered thin films is also achieved. Coloring and bleaching times are drastically reduced to 5.5 s and < 1.3 s as compared to only WO3 films having these values as 13.4 and 4.1 s respectively. We further investigates electrochromic films for different states and concentrations by XPS, electrochemical impedance spectroscopy (EIS) for electronic/ionic conductivity comparison and visible spectroscopy to verify optical modulation and calculation of some optical constants.
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