MeV-SIMS measurement of lithium-containing electrolyte

Secondary ion mass spectrometry (SIMS) is a method with high surface sensitivity that allows both elemental and molecular analysis. The MeV-SIMS technique uses heavy ion beams with energy in the MeV range, and samples can be measured under ambient conditions because of the high transmission capability of these ions at low vacuum pressures. Ambient MeV-SIMS is a suitable method for investigating the reactions at the electrode-electrolyte interface. In contrast, however, in this method, chemical noise originating from ionized residual gases can be found with high intensity. Under the conditions, signals from the surface have to be distinguished from the chemical noise. In this paper, MeV-SIMS measurements of a Li-containing electrolyte were performed and a method was established for separating out chemical noise and signals from the sample surface. The detection of a number of Li-containing electrolytic compounds from the sample surface by an ambient MeV-SIMS system was successful.