期刊
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE
卷 51, 期 11, 页码 5945-5957出版社
SPRINGER
DOI: 10.1007/s11661-020-05967-y
关键词
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资金
- National Science Centre, Poland (NCN) [UMO-2014/15/D/ST8/00542, UMO-2017/25/B/ST8/00134]
- EU [POWR.03.02.0000-I004/16]
In this work, the stress gradient in mechanically polished tungsten sample was studied using X-ray diffraction methods. To determine in-depth stress evolution in the very shallow subsurface region (up to 10 mu m), special methods based on reflection geometry were applied. The subsurface stresses (depth up to 1 mu m) were measured using the multiple-reflection grazing incidence X-ray diffraction method with classical characteristic X-rays, while the deeper volumes (depth up to 10 mu m) were investigated using energy-dispersive diffraction with white high energy synchrotron beam. Both complementary methods allowed for determining in-depth stress profile and the evolution of stress-free lattice parameter. It was confirmed that the crystals of tungsten are elastically isotropic, which simplifies the stress analysis and makes tungsten a suitable material for testing stress measurement methods. Furthermore, it was found that an important compressive stress of about - 1000 MPa was generated on the surface of the mechanically polished sample, and this stress decreases to zero value at the depth of about 9 mu m. On the other hand, the strain-free lattice parameter does not change significantly in the examined subsurface region.
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