Measuring count rates free from correlated noise in digital silicon photomultipliers

The characterization of nuisance parameters in digital silicon photomultipliers (SiPMs) is important to their understanding and future development. Methods able to distinguish the types of events are necessary to obtain fair and legitimate measurements. In this work, the zero photon probability (ZPP) method and the time delay (TD) method are used to measure the dark noise of digital SiPMs free from the contribution of correlated noise such as afterpulsing and crosstalk. It highlights the unique features of digital SiPMs such as the holdoff delay, the digital output signal, and the embedded processing (e.g. the selection of the interval sampling width). The two methods correctly separate the correlated and uncorrelated events in digital SiPMs and therefore the determination of a true photon detection efficiency (PDE) is possible. The ZPP method is also implemented inside a digital SiPM using embedded digital signal processing.

Automated summary

The characterization of nuisance parameters in digital SiPMs using ZPP and TD methods enables the correct separation of correlated and uncorrelated events, allowing for the determination of true PDE.