The X-ray emission of cerium oxide

Using a combination of spectral simulation with FEFF and experimental data for metallic Ce, it has been possible to extract the Cerium Oxide-only M-4,M-5 X-ray Emission Spectrum (XES) from an experimental result, which had been produced utilizing a combined CeOxide/Ce sample. It is shown that the XES emission for CeOxide-only is significantly different for the M-4 and M-5 edges, with the M-4 XES consistent with normal XES and the M-5 XES exhibiting a continued enhancement associated with a threshold effect, connected to Resonant Inverse Photoelectron Spectroscopy (RIPES).

Automated summary

By combining spectral simulation with FEFF and experimental data, the Cerium Oxide-only M-4, M-5 X-ray Emission Spectrum (XES) has been extracted from an experimental result using a combined CeOxide/Ce sample. The XES emission for CeOxide-only shows significant differences at the M-4 and M-5 edges, with the M-4 XES consistent with normal XES and the M-5 XES exhibiting a continued enhancement connected to Resonant Inverse Photoelectron Spectroscopy (RIPES).