期刊
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
卷 246, 期 -, 页码 -出版社
ELSEVIER
DOI: 10.1016/j.elspec.2020.147007
关键词
X-ray emission; Rare earths; Oxides
类别
资金
- U.S. Department of Energy, National Nuclear Security Administration [DE-AC52-07NA27344]
By combining spectral simulation with FEFF and experimental data, the Cerium Oxide-only M-4, M-5 X-ray Emission Spectrum (XES) has been extracted from an experimental result using a combined CeOxide/Ce sample. The XES emission for CeOxide-only shows significant differences at the M-4 and M-5 edges, with the M-4 XES consistent with normal XES and the M-5 XES exhibiting a continued enhancement connected to Resonant Inverse Photoelectron Spectroscopy (RIPES).
Using a combination of spectral simulation with FEFF and experimental data for metallic Ce, it has been possible to extract the Cerium Oxide-only M-4,M-5 X-ray Emission Spectrum (XES) from an experimental result, which had been produced utilizing a combined CeOxide/Ce sample. It is shown that the XES emission for CeOxide-only is significantly different for the M-4 and M-5 edges, with the M-4 XES consistent with normal XES and the M-5 XES exhibiting a continued enhancement associated with a threshold effect, connected to Resonant Inverse Photoelectron Spectroscopy (RIPES).
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