期刊
JOURNAL OF APPLIED PHYSICS
卷 128, 期 10, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/5.0019967
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资金
- Deutsche Forschungsgemeinschaft (DFG) [AL 560/19-1]
In this work, we report nearly single oriented {001}-textured ferroelectric PbZr0:52Ti0:48O3 thin films grown by pulsed laser deposition onto AISI 304 stainless steel substrates. Pt, Al2O3, and LaNiO3 buffer layers promote the PbZr0:52Ti0:48O3 {001} texture and protect the substrate against oxidation during deposition. The dominant {001} texture of the PbZr0:52Ti0:48O3 layer was confirmed using x-ray and electron backscatter diffraction. Before poling, the films exhibit a permittivity of about 350 at 1 kHz and a dielectric loss below 5%. The films display a remanent polarization of about 16:5 mu Ccm(2) and a high coercive field of up to E-c 1/4 135:9 kVcm(-1). The properties of these PbZr0:52Ti0:48O3 thin films on stainless steel are promising for various MEMS applications such as transducers or energy harvesters.
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