Image driven machine learning methods for microstructure recognition

Computer vision and machine learning methods were applied to the challenge of automatic microstructure recognition. Here, a case study on dendritic morphologies was performed. Two classification tasks were completed, and involved distinguishing between micrographs that depict dendritic morphologies from those that do not contain this particular microstructural feature (Task 1), and from those micrographs identified as depicting dendrites, different cross-sectional views (longitudinal or transverse) were identified (Task 2). Data sets were comprised of images taken over a range of magnifications, from materials with different compositions and varying orientations of microstructural features. Feature extraction and dimensionality reduction were performed prior to training machine learning algorithms to classify microstructural image data. Visual bag of words, texture and shape statistics, and pre-trained convolutional neural networks (deep learning algorithms) were used for feature extraction. Classification was then performed using support vector machine, voting, nearest neighbors, and random forest models. For each model, classification was completed using full (original size) and reduced feature vectors for each feature extraction method tested. Performance comparisons were done to evaluate all possible combinations of feature extraction, selection, and classifiers for the task of micrograph classification. Results demonstrate that pre-trained neural networks represent microstructure image data well, and when used for feature extraction yield the highest classification accuracies for the majority of classifier and feature selection methods tested. Thus, deep learning algorithms can successfully be applied to micrograph recognition tasks. Maximum classification accuracies of 91.85 +/- 4.25% and 97.37 +/- 3.33% for Tasks 1 and 2 respectively, were achieved. This work is a broad investigation of computer vision and machine learning methods that acts as a step towards applying these established methods to more sophisticated materials recognition or characterization tasks. The approach presented here could offer improvements over established stereological measurements by removing the requirement of expert knowledge (bias) for interpretation of image data prior to characterization. (C) 2016 Elsevier B.V. All rights reserved.