4.5 Article

Layer etching of mica nanosheets using a focused electron beam

期刊

APPLIED PHYSICS EXPRESS
卷 13, 期 10, 页码 -

出版社

IOP PUBLISHING LTD
DOI: 10.35848/1882-0786/abb385

关键词

mica; phlogopite; layer etching; focused electron beam; scanning Auger electron spectroscopy; microscopy; atomic force microscopy

资金

  1. Japan Society for the Promotion of Science [18H03879]
  2. Grants-in-Aid for Scientific Research [18H03879] Funding Source: KAKEN

向作者/读者索取更多资源

Mica, a cleavable layered material, is a single-crystalline phyllosilicate having unique electronic and mechanical properties such as a wide bandgap and tolerance to strong electric fields and high temperatures, and is applicable to flexible electronics. This paper describes the nanometer-level layer etching of mica nanosheets exfoliated from artificially synthesized phlogopite and affixed on substrates, using a focused electron beam for fine-pattern fabrication of the nanosheets. The dependence of the etching on the irradiation time, beam current, and beam energy is examined. The etching process was analyzed by in situ scanning Auger electron spectroscopy and microscopy. The layer etching of mica nanosheets leads to the micro- and nano-fabrication of mica-based two-dimensional heterodevices.

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