期刊
APPLIED OPTICS
卷 60, 期 4, 页码 A8-A14出版社
OPTICAL SOC AMER
DOI: 10.1364/AO.403687
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资金
- Bundesministerium fur Bildung und Forschung [13N13015, 16KIS0026, 16KIS0695]
This paper introduces a confocal laser scanning holographic microscope for investigating buried structures, which combines high diffraction limited resolution and high signal-to-noise-ratio with phase acquisition ability. The amplitude and phase imaging capabilities are demonstrated on a test target, and an optical beam induced current modality is added for studying buried integrated semiconductor structures, providing additional structure-sensitive contrast. The performance of the multimodal system is demonstrated by imaging the buried structures of a microcontroller through the silicon backside in reflection geometry.
In this paper, we present a confocal laser scanning holographic microscope for the investigation of buried structures. The multimodal system combines high diffraction limited resolution and high signal-to-noise-ratio with the ability of phase acquisition. The amplitude and phase imaging capabilities of the system are shown on a test target. For the investigation of buried integrated semiconductor structures, we expand our system with an optical beam induced current modality that provides additional structure-sensitive contrast. We demonstrate the performance of the multimodal system by imaging the buried structures of a microcontroller through the silicon backside of its housing in reflection geometry. (C) 2020 Optical Society of America
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