期刊
SCRIPTA MATERIALIA
卷 185, 期 -, 页码 30-35出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2020.04.005
关键词
On-axis Transmission Kikuchi Diffraction (TKD); HR-TKD; Nanostructured materials; Severe Plastic Deformation (SPD); Electron diffraction
Global Digital Image Correlation (DIC) is applied on the electron diffraction patterns acquired by the on-axis Transmission Kikuchi Diffraction (TKD) technique. High-angular resolution (HR-TKD) mappings of the grain internal disorientations and the associated geometrically necessary dislocation densities are then derived at a nanoscale resolution. Tailored for the fine characterization of nanomaterials in the scanning electron microscope (SEM), the method is illustrated on a nanostructured high-purity aluminium processed by severe plastic deformation (SPD) and its performances are discussed in the light of imaging by transmission electron microscopy (TEM) and by SEM using a forescatter electron detector (FSD). (C) 2020 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据