期刊
PATTERN RECOGNITION
卷 102, 期 -, 页码 -出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.patcog.2020.107205
关键词
Scene recognition; Patch feature encoding; Spatial layout pattern learning; Discriminative region detection; Convolutional neural networks; Deep learning
资金
- Programme for Professor of Special Appointment (Eastern Scholar) at Shanghai Institutions of Higher Learning
- JSPS KAKENHI [15K00159]
- Grants-in-Aid for Scientific Research [15K00159] Funding Source: KAKEN
With the success of deep learning in the field of computer vision, object recognition has made important breakthroughs, and its recognition accuracy has been drastically improved. However, the performance of scene recognition is still not sufficient to some extent because of complex configurations. Over the past several years, scene recognition algorithms have undergone important evolution as a result of the development of machine learning and Deep Convolutional Neural Networks (DCNN). This paper reviews many of the most popular and effective approaches to scene recognition, which is expected to create benefits for future research and practical applications. We seek to establish relationships among different algorithms and determine the critical components that lead to remarkable performance. Through the analysis of some representative schemes, motivation and insights are identified, which will help to facilitate the design of better recognition architectures. In addition, current available scene datasets and benchmarks are presented for evaluation and comparison. Finally, potential problems and promising directions are highlighted. (C) 2020 Elsevier Ltd. All rights reserved.
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