Synthesis, structural and optical properties of mesostructured, X-doped NiO (x = Zn, Sn, Fe) nanoflake network films

Mesostructured nickel oxide (NiO) nanoflake network films doped with zinc (Zn), tin (Sn), and iron (Fe), were grown by a one-step solution immersion method at 120 degrees C on indium-doped tin oxide (ITO) glass substrates. Field emission scanning electron microscope images revealed that the NiO nanoflake networks doped with Zn, Sn, and Fe, grew on the ITO but with different nanoflake morphologies and thicknesses, and their growth mechanisms are discussed. The X-ray diffraction patterns show that all grown films exhibited polycrystalline NiO structures. Substantial modifications and anomalies in the NiO film's morphology, thickness, lattice constant, stress/strain, crystallite size, and dislocation density, were observed when doped with the different sources. The optical and electrical properties also altered after the doping process. The Raman spectra indicated that all the films exhibited cubic NiO structures with paramagnetic characteristics. Moreover, the characteristic deviations in the doped NiO nanoflake network films have been thoroughly discussed.