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State-of-the-art active optical techniques for three-dimensional surface metrology: a review [Invited]

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OPTICAL SOC AMER
DOI: 10.1364/JOSAA.398644

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  1. Fulbright Colombia
  2. Directorate for Computer and Information Science and Engineering [IIS-1637961, IIS-1763689]
  3. Engineering and Physical Sciences Research Council [EP/P006930/1, EP/T024844/1]
  4. EPSRC [EP/P006930/1, EP/T024844/1] Funding Source: UKRI

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This paper reviews recent developments of non-contact three-dimensional (3D) surface metrology using an active structured optical probe. We focus primarily on those active non-contact 3D surface measurement techniques that could be applicable to the manufacturing industry. We discuss principles of each technology, and its advantageous characteristics aswell as limitations. Towards the end, we discuss our perspectives on the current technological challenges in designing and implementing these methods in practical applications. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License.

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