Structure, spectral analysis and microwave dielectric properties of novel x(NaBi)0.5MoO4-(1-x)Bi2/3MoO4 (x=0.2 ∼ 0.8) ceramics with low sintering temperatures

Herein, the x(NaBi)(0.5)MoO4-(1-x)Bi2/3MoO4, (xNBM-(1-x)BMO, x = 0.2 similar to 0.8) microwave dielectric ceramics with low sintering temperatures were prepared via the traditional solid-state method to adjust the i f value and dielectric constant. The crystal structure was determined using X-Ray diffraction and Raman spectroscopy, the microstructure was investigated using scanning electron micrograph and energy disperse spectroscopy, and the dielectric properties were studied using a network analyser and infrared spectroscopy. For the xNBM-(1-x)BMO composite ceramics, the (NaBi)(0.5)MoO4 tetragonal phase coexisted with the Bi2/3MoO4 monoclinic phase. With the rise of x value, the permittivity increased from 23.7-29.8, and the tau(f) value shifited from -53.3 ppm/degrees C to -13.7 ppm/degrees C. The 0.8NBM-0.2BMO ceramic sintered at 680 degrees C possessed excellent microwave dielectric properties with a epsilon(r) = 29.8 (6.7 GHz), a Qf = 11,800 GHz, and a tau(f) = -13.7 ppm/degrees C. These results made the xNBM-(1-x)BMO composite ceramics great candidates in low temperature co-fired ceramics technology.