期刊
IEEE TRANSACTIONS ON POWER ELECTRONICS
卷 35, 期 6, 页码 6050-6060出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TPEL.2019.2952633
关键词
Electromagnetic interference; partial discharges; semiconductor device packaging; wide band gap semiconductors
资金
- U.K. Engineering and Physical Sciences Research Council [EP/K035304/1]
- CPES High Density Integration Consortium
- EPSRC [EP/K035304/1] Funding Source: UKRI
The advancement of silicon carbide (SiC) power devices with voltage ratings exceeding 10 kV is expected to revolutionize medium- and high-voltage systems. However, present power module packages are limiting the performance of these unique switches. The objective of this research is to push the boundaries of high-density, high-speed, 10-kV power module packaging. The proposed package addresses the well-known electromagnetic and thermal challenges, as well as the prominent electrostatic and electromagnetic interference (EMI) issues associated with high-speed, 10-kV devices. The high-speed switching and high voltage rating of these devices causes significant EMI and high electric fields. Existing power module packages are unable to address these challenges, resulting in detrimental EMI and partial discharge that limit the converter operation. This article presents the design and testing of a 10-kV SiC MOSFET power module that switches at a record 250 V/ns without compromising the signal and ground integrity due to an integrated screen reduces the common-mode current by ten times. This screen connection simultaneously increases the partial discharge inception voltage by more than 50%. With the integrated cooling system, the power module prototype achieves a power density of 4 W/mm(3).
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