4.8 Article

Broad Convolutional Neural Network Based Industrial Process Fault Diagnosis With Incremental Learning Capability

期刊

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
卷 67, 期 6, 页码 5081-5091

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIE.2019.2931255

关键词

Fault diagnosis; Feature extraction; Maximum likelihood detection; Nonlinear filters; Convolutional neural networks; Neurons; Broad learning system; convolutional neural network; fault diagnosis; incremental learning

资金

  1. NSFC-Zhejiang Joint Fund for the Integration of Industrialization and Informatization [U1709211]
  2. Zhejiang Key Research and Development Project [2019C03100, 2019C01048]

向作者/读者索取更多资源

Fault diagnosis, which identifies the root cause of the observed out-of-control status, is essential to counteracting or eliminating faults in industrial processes. Many conventional data-driven fault diagnosis methods ignore the fault tendency of abnormal samples, and they need a complete retraining process to include the newly collected abnormal samples or fault classes. In this article, a broad convolutional neural network (BCNN) is designed with incremental learning capability for solving the aforementioned issues. The proposed method combines several consecutive samples as a data matrix, and it then extracts both fault tendency and nonlinear structure from the obtained data matrix by using convolutional operation. After that, the weights in fully connected layers can be trained based on the obtained features and their corresponding fault labels. Because of the architecture of this network, the diagnosis performance of the BCNN model can be improved by adding newly generated additional features. Finally, the incremental learning capability of the proposed method is also designed, so that the BCNN model can update itself to include new coming abnormal samples and fault classes. The proposed method is applied both to a simulated process and a real industrial process. Experimental results illustrate that it can better capture the characteristics of the fault process, and effectively update diagnosis model to include new coming abnormal samples, and fault classes.

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