4.8 Article

2-D Materials for Ultrascaled Field-Effect Transistors: One Hundred Candidates under the Ab Initio Microscope

期刊

ACS NANO
卷 14, 期 7, 页码 8605-8615

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acsnano.0c02983

关键词

2-D materials; ab initio device simulation; next-generation field-effect transistors; performance comparison; materials and device parameters

资金

  1. ETH Zurich [ETH-32 15-1]
  2. Swiss National Science Foundation (SNSF) [200021_175479]
  3. NCCR MARVEL
  4. Piz Daint at CSCS [pr28]
  5. CINECA [2016163963]
  6. CSCS [s876]
  7. Swiss National Science Foundation (SNF) [200021_175479] Funding Source: Swiss National Science Foundation (SNF)

向作者/读者索取更多资源

Due to their remarkable properties, single-layer 2-D materials appear as excellent candidates to extend Moore's scaling law beyond the currently manufactured silicon FinFETs. However, the known 2-D semiconducting components, essentially transition metal dichalcogenides, are still far from delivering the expected performance. Based on a recent theoretical study that predicts the existence of more than 1800 exfoliable 2-D materials, we investigate here the 100 most promising contenders for logic applications. Their current versus voltage characteristics are simulated from first-principles, combining density functional theory and advanced quantum transport calculations. Both n- and p-type configurations are considered, with gate lengths ranging from 15 down to 5 nm. From this large collection of electronic materials, we identify 13 compounds with electron and hole currents potentially much higher than those in future Si FinFETs. The resulting database widely expands the design space of 2-D transistors and provides original guidelines to the materials and device engineering community.

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