期刊
OPTICA
卷 7, 期 6, 页码 702-707出版社
Optica Publishing Group
DOI: 10.1364/OPTICA.392363
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资金
- National Science Foundation [IIP-1827720]
- Defense Advanced Research Projects Agency [W31P4Q-15-1-0013]
- Air Force Office of Scientific Research [FA9550-15-1-0303, FA9550-19-1-0310, FA9550-19-1-0376]
- Vetenskapsradet [2017-05309]
- Vinnova [2017-05309] Funding Source: Vinnova
- Swedish Research Council [2017-05309] Funding Source: Swedish Research Council
The measurement and stabilization of the carrier-envelope offset frequency f(CEO) via self-referencing is paramount for optical frequency comb generation, which has revolutionized precision frequency metrology, spectroscopy, and optical clocks. Over the past decade, the development of chip-scale platforms has enabled compact integrated waveguides for supercontinuum generation. However, there is a critical need for an on-chip self-referencing system that is adaptive to different pump wavelengths, requires low pulse energy, and does not require complicated processing. Here, we demonstrate efficient f(CEO) stabilization of a modelocked laser with only 10(7) pJ of pulse energy via self-referencing in an integrated lithium niobate waveguide. We realize an f-2f interferometer through second-harmonic generation and subsequent supercontinuum generation in a single dispersion-engineered waveguide with a stabilization performance equivalent to a conventional off-chip module. The f(CEO) beatnote is measured over a pump wavelength range of 70 nm. We theoretically investigate our system using a single nonlinear envelope equation with contributions from both second and third-order nonlinearities. Our modeling reveals rich ultrabroadband nonlinear dynamics and confirms that the initial second-harmonic generation followed by supercontinuum generation with the remaining pump is responsible for the generation of a strong f(CEO) signal as compared to a traditional f-2f interferometer. Our technology provides a highly simplified system that is robust, low in cost, and adaptable for precision metrology for use outside a research laboratory. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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