4.4 Article

Measuring the surface bonding energy: A comparison between the classical double-cantilever beam experiment and its nanoscale analog

相关参考文献

注意:仅列出部分参考文献,下载原文获取全部文献信息。
Article Nanoscience & Nanotechnology

Locally measuring the adhesion of InP directly bonded on sub-100 nm patterned Si

K. Pantzas et al.

NANOTECHNOLOGY (2016)

Article Materials Science, Multidisciplinary

Water Stress Corrosion in Bonded Structures

F. Fournel et al.

ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY (2015)

Article Materials Science, Multidisciplinary

Evaluation of InP-to-silicon heterobonding

D Pasquariello et al.

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY (2001)

Article Electrochemistry

Mesa-spacers: Enabling nondestructive measurement of surface energy in room temperature wafer bonding

D Pasquariello et al.

JOURNAL OF THE ELECTROCHEMICAL SOCIETY (2000)