4.8 Article

Role of Pressure in the Growth of Hexagonal Boron Nitride Thin Films from Ammonia-Borane

期刊

CHEMISTRY OF MATERIALS
卷 28, 期 12, 页码 4169-4179

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acs.chemmater.6b00396

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资金

  1. U.S. Office of Naval Research (ONR) [N00014-13-1-0300]
  2. Air Force Office of Scientific Research (AFOSR) [FA9550-14-1-0251]
  3. National Science Foundation (NSF) under CHE [10-38015, 13-07002, 13-62931, ECCS-1430530]
  4. National Defense Science and Engineering Graduate Fellowship (NDSEG) through the Army Research Office (ARO)
  5. Beckman Foundation
  6. Naval Research Enterprise Intern Program (NREIP)
  7. National Research Council Research Associateship Award at the Naval Research Laboratory
  8. Division Of Chemistry
  9. Direct For Mathematical & Physical Scien [1362931] Funding Source: National Science Foundation

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We analyze the optical, chemical, and electrical properties of chemical vapor deposition (CVD) grown hexagonal boron nitride (h-BN) using the precursor ammonia-borane (H3N-BH3) as a function of Ar/H-2 background pressure (P-TOT). Films grown at P-TOT <= 2.0 Torr are uniform in thickness, highly crystalline, and consist solely of h-BN. At larger P-TOT with constant precursor flow, the growth rate increases, but the resulting h-BN is more amorphous, disordered, and sp(3)-bonded. We attribute these changes in h-BN grown at high pressure to incomplete thermolysis of the H3N-BH3 precursor from a passivated Cu catalyst. A similar increase in h-BN growth rate and amorphization is observed even at low P-TOT if the H3N-BH3 partial pressure is initially greater than the background pressure P-TOT at the beginning of growth. h-BN growth using the H3N-BH3 precursor reproducibly can give large-area, crystalline h-BN thin films, provided that the total pressure is under 2.0 Torr and the precursor flux is well controlled.

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