Optimal designs and reliability sampling plans for one-shot devices with cost considerations

In this paper, we investigate some statistical inference, optimal design, and reliability sampling plan problems related to multiple constant-stress accelerated life test with one-shot device testing. At each stress-level combination, a generalized exponential lifetime distribution is considered. The scale parameter of the proposed distribution is assumed to be a log-linear function of stresses. To conduct a one-shot device accelerated life test more efficiently, one has to address the problem of determining optimal setting that produces the best estimation results. In practice, the experimental budget is always limited. The size of budget usually influences the decision of experimental setting and hence, influences the precision of estimation. Therefore, this paper is to determine the optimal experimental setting under D-optimality criterion with cost constraint. In addition, reliability sampling plan is an important statistical tool in the area of quality control. This paper is also to explore the optimal reliability sampling plan which minimizes the total experimental cost of a one-shot device accelerated life test with specified producer's risk and consumer's risk.