4.8 Article

Electronic nematicity in Sr2RuO4

出版社

NATL ACAD SCIENCES
DOI: 10.1073/pnas.1921713117

关键词

electronic nematicity; strontium ruthenate; molecular-beam epitaxy; angle-resolved transverse resistivity

资金

  1. US Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division
  2. Gordon and Betty Moore Foundation's EPiQS Initiative Grant [GBMF9074]
  3. National Science Foundation [DMR-1539918]
  4. W.M. Keck Foundation
  5. National Science Foundation Graduate Research Fellowship Program [DGE-1650441]
  6. Gordon and Betty Moore Foundation [GBMF9073]
  7. NSF [ECCS-1542081]

向作者/读者索取更多资源

We have measured the angle-resolved transverse resistivity (ARTR), a sensitive indicator of electronic anisotropy, in high-quality thin films of the unconventional superconductor Sr2RuO4 grown on various substrates. The ARTR signal, heralding the electronic nematicity or a large nematic susceptibility, is present and substantial already at room temperature and grows by an order of magnitude upon cooling down to 4 K. In Sr2RuO4 films deposited on tetragonal substrates the highest-conductivity direction does not coincide with any crystallographic axis. In films deposited on orthorhombic substrates it tends to align with the shorter axis; however, the magnitude of the anisotropy stays the same despite the large lattice distortion. These are strong indications of actual or incipient electronic nematicity in Sr2RuO4.

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