期刊
OPTICS EXPRESS
卷 28, 期 11, 页码 16749-16763出版社
OPTICAL SOC AMER
DOI: 10.1364/OE.393363
关键词
-
类别
资金
- European Research Council [695140]
- Wellcome Trust [203285/C/16/Z]
- Engineering and Physical Sciences Research Council [EP/L016052/1]
- Wellcome Trust [203285/C/16/Z] Funding Source: Wellcome Trust
Sensorless adaptive optics is commonly used to compensate specimen-induced aberrations in high-resolution fluorescence microscopy, but requires a bespoke approach to detect aberrations in different microscopy techniques, which hinders its widespread adoption. To overcome this limitation, we propose using wavelet analysis to quantify the loss of resolution due to the aberrations in microscope images. By examining the variations of the wavelet coefficients at different scales, we are able to establish a multi-valued image quality metric that can be successfully deployed in different microscopy techniques. To corroborate our arguments, we provide experimental verification of our method by performing aberration correction experiments in both confocal and STED microscopy using three different specimens. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据