期刊
OPTICS EXPRESS
卷 28, 期 7, 页码 10179-10198出版社
Optica Publishing Group
DOI: 10.1364/OE.388248
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资金
- European Research Council [802567]
- Technion-Israel Institute of Technology
- Zuckerman Foundation
- European Research Council (ERC) [802567] Funding Source: European Research Council (ERC)
In microscopy, proper modeling of the image formation has a substantial effect on the precision and accuracy in localization experiments and facilitates the correction of aberrations in adaptive optics experiments. The observed images are subject to polarization effects, refractive index variations, and system specific constraints. Previously reported techniques have addressed these challenges by using complicated calibration samples, computationally heavy numerical algorithms, and various mathematical simplifications. In this work, we present a phase retrieval approach based on an analytical derivation of the vectorial diffraction model. Our method produces an accurate estimate of the system's phase information, without any prior knowledge about the aberrations, in under a minute. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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