期刊
MICROSCOPY AND MICROANALYSIS
卷 26, 期 2, 页码 258-266出版社
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927620000203
关键词
atom probe tomography; EUV; femtosecond pulse; field ion emission
资金
- NIST Innovations in Measurement Science Program
- CAMECA Instruments
This paper describes initial experimental results from an extreme ultraviolet (EUV) radiation-pulsed atom probe microscope. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV photon energy), obtained through high harmonic generation in an Ar-filled hollow capillary waveguide, successfully triggered controlled field ion emission from the apex of amorphous SiO2 specimens. The calculated composition is stoichiometric within the error of the measurement and effectively invariant of the specimen base temperature in the range of 25 K to 150 K. Photon energies available in the EUV band are significantly higher than those currently used in the state-of-the-art near-ultraviolet laser-pulsed atom probe, which enables the possibility of additional ionization and desorption pathways. Pulsed coherent EUV light is a new and potential alternative to near-ultraviolet radiation for atom probe tomography.
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