Effect of Si on the Growth Behavior of the Fe2Al5 Phase at Al-xSi(liquid)/Fe(solid) Interface During Holding by In-Situ Synchrotron Radiography

Effect of Si on the growth behavior of the Fe2Al5 phase formed at the Al-xSi((liquid))/Fe-(solid) interface during holding was investigated by a synchrotron radiation real-time imaging technique. Results show that growth of the Fe2Al5 phase is accompanied by its simultaneous dissolution into the melt. Addition of Si inhibits the growth of Fe2Al5 to reduce its thickness and change its morphology. The growth and dissolution kinetics of the Fe2Al5 phase are discussed.