期刊
JOURNAL OF PHYSICS D-APPLIED PHYSICS
卷 53, 期 37, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/1361-6463/ab8fdc
关键词
x-ray resonant magnetic reflectivity; magnetic proximity effect; Pt thin films
资金
- EPSRC [EP/S020802/1, EP/S020845/1] Funding Source: UKRI
X-ray resonant magnetic reflectivity (XRMR) is a powerful method to determine the optical, structural and magnetic depth profiles of a variety of thin film systems. Here, we investigate samples of different complexity all measured at the Pt L-3 absorption edge to determine the optimal procedure for the analysis of the experimental XRMR curves, especially for nontrivial bi- and multilayer samples that include differently bonded Pt from layer to layer. The software tool REMAGX is used to fit these data and model the magnetooptic depth profiles based on a highly adaptable layer stack which is modified to be a more precise and physically consistent representation of the real multilayer system. Various fitting algorithms, iterative optimization approaches and a detailed analysis of the asymmetry ratio features as well as chi(2) (goodness of fit) landscapes are utilized to improve the agreement between measurements and simulations. We present a step-by-step analysis procedure tailored to the Pt thin film systems to take advantage of the excellent magnetic sensitivity and depth resolution of XRMR.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据