期刊
BIOINFORMATICS
卷 36, 期 12, 页码 3947-3948出版社
OXFORD UNIV PRESS
DOI: 10.1093/bioinformatics/btaa218
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类别
资金
- AEI/FEDER, UE [SAF2017-84565-R]
- Fundacion R. Areces
A Summary: We have developed a software tool to improve the image quality in focused ion beam-scanning electron microscopy (FIB-SEM) stacks: PolishEM. Based on a Gaussian blur model, it automatically estimates and compensates for the blur affecting each individual image. It also includes correction for artifacts commonly arising in FIB-SEM (e.g. curtaining). PolishEM has been optimized for an efficient processing of huge FIB-SEM stacks on standard computers.
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