4.6 Article

Optimization bandgap gradation structure simulation of Cu2Sn1-xGexS3 solar cells by SCAPS

期刊

SOLAR ENERGY
卷 194, 期 -, 页码 986-994

出版社

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.solener.2019.11.014

关键词

Cu2Sn1-xGexS3 (CTGS); Bandgap gradation structure; Device simulation; Thin film solar cells

资金

  1. National Nature Science Foundation [51102203, 51772255, 11874316, 11474244]
  2. Hunan Provincial Natural Science Foundation of China [2016JJ3122]
  3. National Basic Research Program of China [2015C8921103, 2012CB 921303]
  4. Open Fund based on the Innovation Platform of Hunan Colleges and Universities [11K061]

向作者/读者索取更多资源

The bandgap of the ternary chalcogenide Cu2SnS3 (CTS) can be tuned by alloying with Ge. The performance of CTS based solar cell devices with varies band gap grading profiles have been simulated with respect to the solar cells with a uniform band gap absorbing layer. It was revealed that band gap engineering geared to controlling the grading profile in the absorber layer lead to performance enhancement comparing to that of a device without band gap grading. Moreover, bandgap profiles with various back metal working function (phi(m)) were simulated. An over 4-5% efficiency improvement was obtained due to the increasing phi(m) with different band gap grading profile. The optimum PCE of 15.65%, 19.03% and 19.9% have been obtained with uniform, single and double band gap structures respectively. Moreover, the effects of various defects density on solar cell properties were investigated and the results indicate that there is a threshold of 1 x 10(16) cm(-3) for both acceptor/donor and neutral defects. The depth profile of the carrier recombination rate was calculated to understand of the fundamental device physics. The result show that a great improvement of both V-OC and J(SC) was obtained in the back surface grading structure cell comparing to that of the uniform bandgap cell due to the additional quasi-electric field associated to the affinity (conduction band) variation with position benefitting the carrier collection and reducing the back surface recombination and bulk recombination typically characterized by the diffusion length. A slight enhancement of short-circuit current density without significantly sacrificing the open-circuit voltage was obtained in the double band gap grading structure comparing to the single back grading owing to an increasement of front grading within the SCR.

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