期刊
SMALL
卷 16, 期 14, 页码 -出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/smll.201906198
关键词
contrast; (cryo) transmission electron microscopy; focused ion beam milling; image formation; soft-matter
类别
资金
- DFG [INST 152/772-1, 777-1 FUGG]
- EMBO long-term fellowship [ALTF 356-2018]
With a significant role in material sciences, physics, (soft matter) chemistry, and biology, the transmission electron microscope is one of the most widely applied structural analysis tool to date. It has the power to visualize almost everything from the micrometer to the angstrom scale. Technical developments keep opening doors to new fields of research by improving aspects such as sample preservation, detector performance, computational power, and workflow automation. For more than half a century, and continuing into the future, electron microscopy has been, and is, a cornerstone methodology in science. Herein, the technical considerations of imaging with electrons in terms of optics, technology, samples and processing, and targeted soft materials are summarized. Furthermore, recent advances and their potential for application to soft matter chemistry are highlighted.
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