Reliability modeling for a two-phase degradation system with a change point based on a Wiener process

A two-phase degradation system with a change point is commonly seen in many real-world degradation systems due to influence of internal mechanisms and external environments, such as lithium-ion batteries, light-emitting diodes (LEDs), plasma display panels (PDPs), and vacuum fluorescent displays (VFDs). Random jumps exist at the change points of the degradation processes. Motivated by this phenomenon, this paper attempts to model such kinds of systems based on the Wiener process. Specifically, In Model 1, a constant change point model is first considered. The analytical results of the system reliability, lifetime distribution, and the remaining useful lifetime (RUL) are obtained. Then, based on Model 1, a random change point model, i.e., Model 2, is proposed to explain the change point phenomenon which is influenced by the accumulative effect of a shock process. Two phase-change patterns (PCPs) are considered in Model 2. For PCP I, the change point is triggered when the number of shocks reaches a predetermined threshold. For PCP II, the change point is triggered when the accumulative shock damage exceeds the corresponding threshold. The system reliability indexes are studied by using analytical and simulation methods. Finally, several numerical examples are given to illustrate the approaches and results.