4.7 Article

Photovoltaic defect classification through thermal infrared imaging using a machine learning approach

期刊

PROGRESS IN PHOTOVOLTAICS
卷 28, 期 3, 页码 177-188

出版社

WILEY
DOI: 10.1002/pip.3191

关键词

deep learning; defect classification; defect detection; infrared thermography; machine learning; photovoltaic; random forest; SIFT; support vector machine

资金

  1. Nelson Mandela University
  2. South Africa Statistical Association
  3. National Research Foundation [114628]
  4. Korea Agency for Infrastructure Technology Advancement (KAIA) [114628] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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This study examines a deep learning and feature-based approach for the purpose of detecting and classifying defective photovoltaic modules using thermal infrared images in a South African setting. The VGG-16 and MobileNet models are shown to provide good performance for the classification of defects. The scale invariant feature transform (SIFT) descriptor, combined with a random forest classifier, is used to identify defective photovoltaic modules. The implementation of this approach has potential for cost reduction in defect classification over current methods.

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