期刊
PROGRESS IN PHOTOVOLTAICS
卷 28, 期 3, 页码 177-188出版社
WILEY
DOI: 10.1002/pip.3191
关键词
deep learning; defect classification; defect detection; infrared thermography; machine learning; photovoltaic; random forest; SIFT; support vector machine
资金
- Nelson Mandela University
- South Africa Statistical Association
- National Research Foundation [114628]
- Korea Agency for Infrastructure Technology Advancement (KAIA) [114628] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
This study examines a deep learning and feature-based approach for the purpose of detecting and classifying defective photovoltaic modules using thermal infrared images in a South African setting. The VGG-16 and MobileNet models are shown to provide good performance for the classification of defects. The scale invariant feature transform (SIFT) descriptor, combined with a random forest classifier, is used to identify defective photovoltaic modules. The implementation of this approach has potential for cost reduction in defect classification over current methods.
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