4.6 Article

Effects of annealing conditions on the properties of SnO films deposited by e-beam evaporation process

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MATERIALS LETTERS
卷 257, 期 -, 页码 -

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ELSEVIER
DOI: 10.1016/j.matlet.2019.126737

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SnO films; E-beam evaporation; Annealing; Hall measurements

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The SnO thin films have been deposited on quartz glass substrates using an e-beam evaporation system at room temperature and different post-deposition thermal treatments have been carried out. In case of annealing in air, n-type polycrystalline SnO films are obtained after annealing at 300 degrees C and 400 degrees C, respectively. For the 500 degrees C annealed film, SnO2 phase is generated due to the strong oxidation. However, when annealed in vacuum, pure p-type polycrystalline SnO films are produced. The feasible and controllable methods of p- and n-type SnO films contributes to the development of high performance devices. (C) 2019 Elsevier B.V. All rights reserved.

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