Identifiability of single crystal plasticity parameters from residual topographies in Berkovich nanoindentation on FCC nickel

The information richness of imprints topographies obtained after Berkovich nanoindentation tests at grain scale is assessed for identifying all or part of the parameters of a single crystal plasticity law. In a previous paper (Renner et al., 2016), the strong potential of imprints topographies has been shown through a large experimental campaign conducted on nickel samples. A 3D crystal plasticity finite element modelling (CPFEM) of the nanoindentation experiment using the Meric-Cailletaud has also showed a large sensitivity of residual topographies to the indenter/grain orientation and to the plastic parameters, including the interaction matrix coefficients specifying the interactions between dislocations on different slip systems. This makes imprints topographies very good candidates to provide information for the single crystal parameters identification. The present paper focuses on the Meric-Cailletaud law parameters identifiability using residual topographies. A method is built to define the best well-posed inverse problem to ensure the parameters identification using a crystal plasticity finite element modelling updating (CPFEMU) method. An identifiability index proposed by Richard et al. (Richard et al., 2013) for measuring the information richness of the indentation curve is extended to the analysis of residual topographies. This index quantifies the possibility to achieve a stable/unstable solution using an inverse method. For the studied behaviour, the results show that eight of the nine Meric-Cailletaud law parameters can be identified using three topographies. (C) 2020 Elsevier Ltd. All rights reserved.