4.7 Article

The effects of loop size on the unfaulting of Frank loops in heavy ion irradiation

期刊

JOURNAL OF NUCLEAR MATERIALS
卷 529, 期 -, 页码 -

出版社

ELSEVIER
DOI: 10.1016/j.jnucmat.2019.151942

关键词

Stainless steel; Irradiation; Frank loop; Perfect loop; Unfault

资金

  1. JSPS KAKENHI, Japan [17H01372]
  2. Fund of Key Laboratory of Advanced Materials of Ministry of Education, China [XJCL201901]
  3. Grants-in-Aid for Scientific Research [17H01372] Funding Source: KAKEN

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When stainless steels are exposed to high irradiation dose, a fraction of Frank loops will unfault and transform into perfect loops. After unfaulting, perfect loops can glide and impinge into other loops to form dislocation networks, and dislocation networks will act as sinks for point defects and solute elements. Besides, unfaulting will influence the extent of irradiation hardening as well. Based on previous theories, the size of Frank loops was considered to be a key factor in unfaulting. To better understand the unfaulting process, 316L stainless steel model alloy was irradiated to 5dpa at 350 degrees C, 400 degrees C and 450 degrees C by 3 MeV Ni ions. Method was developed to quantitatively compare the size and density between Frank loops and perfect loops through relrod and weak-beam dark field techniques. Results showed that unfaulting barely occurred at 350 degrees C but was distinct at 400 degrees C and 450 degrees C. The majority of perfect loops were in the size range of 8-16 nm at 400 degrees C and were in the size range of 12-20 nm at 450 degrees C. The existence of a critical loop size for unfaulting was not supported by our results. Moreover, by our results, the energy of Frank loops does not play a decisive role in unfaulting, and the simple approximation of geometric constraint in the rate theory to calculate unfaulting diameter needs to be revisited. Irradiation hardening was also analyzed by nano-indention. It was found that loop unfaulting played an important role in the hardening decrease from 350 degrees C to 450 degrees C. (C) 2019 Elsevier B.V. All rights reserved.

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