4.8 Article

Design, Analysis, and Discussion of Short Circuit and Overload Gate-Driver Dual-Protection Scheme for 1.2-kV, 400-A SiC MOSFET Modules

期刊

IEEE TRANSACTIONS ON POWER ELECTRONICS
卷 35, 期 3, 页码 3054-3068

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TPEL.2019.2930048

关键词

Gate-driver; overcurrent protection; parasitic inductance; SiC MOSFET module

资金

  1. LG Electronics

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This paper proposes short circuit and overload gate-driver dual-protection scheme based on the parasitic inductance between the Kelvin- and power-source terminals of high-current SiC mosfet modules. The paper presents a comprehensive analysis of the two schemes in question, including worst-case analysis used to assess their parametric dependence due to manufacturing tolerances and temperature variations, as well as the in-depth design procedure that can be generally applied to any power module containing a Kelvin-source. For verification, a compact 1.2-kV, 400-A half-bridge module integrating the two protection circuits was developed. The results obtained demonstrate a response time within tens of nanoseconds, and effectively validate their functionality under short circuit and overload scenarios. Finally, a 100-kW, 400-V dc three-phase voltage-source inverter was used to demonstrate the gate-driver with integrated protection functions under 105 degrees C ambient temperature conditions.

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