4.6 Article

Enhanced Power and Electromagnetic SCA Resistance of Encryption Engines via a Security-Aware Integrated All-Digital LDO

期刊

IEEE JOURNAL OF SOLID-STATE CIRCUITS
卷 55, 期 2, 页码 478-493

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSSC.2019.2945944

关键词

Encryption; Resistance; Clocks; Engines; Regulators; Voltage control; Advanced encryption standard (AES); all-digital clock modulation (ADCM); correlation electromagnetic (EM) analysis (CEMA); countermeasures; correlation power analysis (CPA); digital low-dropout (DLDO); EM emanations; information leakage; Internet of Thing (IoT); lightweight cryptography; noise injection; side-channel analysis (SCA); SIMON; SNR; supply and clock randomization; test vector leakage assessment (TVLA)

资金

  1. Intel Corporation
  2. Semiconductor Research Corporation through TxACE [2810.002, 2712.002]

向作者/读者索取更多资源

This article demonstrates enhanced power (P) and electromagnetic (EM) side-channel analysis (SCA) attack resistance of standard (unprotected) 128-bit advanced encryption standard (AES) engines with parallel (P-AES, 128-bit) and serial (S-AES, 8-bit) datapaths and a 128-bit SIMON engine with the bit-serial (1-bit) datapath by an on-die security-aware all-digital low-dropout (DLDO) regulator. The proposed DLDO improves SCA resistance using control-loop-induced perturbations in a nominal DLDO, enhanced by a random switching noise injector (SNI) by power-stage control and a randomized reference voltage (R-VREF) generator coupled with all-digital clock modulation (ADCM). SCA performed on the measured power/EM signatures acquired from a 130-nm CMOS testchip demonstrates up to 25 $\times $ reduction in test vector leakage assessment (TVLA) leakage for P-AES and 3579 $\times $ , 2182 $\times $ , and 500 $\times $ increase in minimum-traces-to-disclose (MTD) 80 of the subkeys for P-AES, S-AES, and SIMON cores, respectively, with respect to correlation power analysis (CPA) and correlation EM analysis (CEMA).

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