期刊
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
卷 126, 期 2, 页码 -出版社
SPRINGER HEIDELBERG
DOI: 10.1007/s00339-020-3301-6
关键词
Thin films; X-ray diffraction; Optical properties
资金
- National Project Research (PNR)
- LASPI2A Laboratory of Khenchela University (Algeria)
Pure and Cu doped ZnO films were grown by ultrasonic spray pyrolysis onto glass substrates at 450 degrees C for 30 min. This study aims to investigate the influence of Cu doping content [0.02-0.20] on structural, microstructural and optical properties. X-ray diffraction analysis reveals a structural disorder depending on Cu loading besides the appearance of CuO phase. The doping effectiveness is revealed by EDX analysis of the chemical composition of the films. The transmittance shows a decreasing tendency with increasing Cu concentration. The refractive indices increase, whereas the values of forbidden energy gap decrease with the increase in Cu dopant concentration.
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