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Optical Sensors for Multi-Axis Angle and Displacement Measurement Using Grating Reflectors

期刊

SENSORS
卷 19, 期 23, 页码 -

出版社

MDPI
DOI: 10.3390/s19235289

关键词

optical sensor; multi-axis angle and displacement measurement; dimensional metrology; planar encoder; planar scale grating; interference lithography

资金

  1. Japan Society for the Promotion of Science (JSPS)

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In dimensional metrology it is necessary to carry out multi-axis angle and displacement measurement for high-precision positioning. Although the state-of-the-art linear displacement sensors have sub-nanometric measurement resolution, it is not easy to suppress the increase of measurement uncertainty when being applied for multi-axis angle and displacement measurement due to the Abbe errors and the influences of sensor misalignment. In this review article, the state-of-the-art multi-axis optical sensors, such as the three-axis autocollimator, the three-axis planar encoder, and the six-degree-of-freedom planar encoder based on a planar scale grating are introduced. With the employment of grating reflectors, measurement of multi-axis translational and angular displacement can be carried out while employing a single laser beam. Fabrication methods of a large-area planar scale grating based on a single-point diamond cutting with the fast tool servo technique and the interference lithography are also presented, followed by the description of the evaluation method of the large-area planar scale grating based on the Fizeau interferometer.

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