期刊
OPTIK
卷 196, 期 -, 页码 -出版社
ELSEVIER GMBH
DOI: 10.1016/j.ijleo.2019.163140
关键词
Optical characteristics of SnS; Thermal evaporated thin films; Nonlinear refractive index; Linear optical susceptibility; Absorption coefficient; Direct energy gap
类别
Thickness relying on linear and nonlinear optical properties of fin sulfide thin films has been studied. Tin sulfide thin films were grown utilizing thermal evaporation technique. SnS films have polycrystalline nature with orthorhombic structure shown from X-ray diffraction study. Transmission and reflection spectrum has been taken utilizing VIS-NIR spectrophotometer in the wavelength range 300-1100 nm. Linear optical properties of thin films indicate let direct and indirect transition type and the band gap increased with film thickness. The third order nonlinear optical susceptibility chi(3) and nonlinear refractive index n(2) has been determined by mathematical calculation.
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