The exchange bias effect on single layer of Fe-rich FeRh thin film

Thin films of Fe rich FeRh were prepared by using DC magnetron sputtering from a Fe67Rh33 target onto MgO (0 0 1) substrate. In particular, here we identify a unique exchange-bias phenomenon. This is one of the homogenous system to have an exchange bias phenomena without the presence of two layer system with well-defined interface of ferromagnetic (FM)/antiferromagnetic (AFM) layers. Meanwhile, annealing at higher temperatures resulted in ordering of FeRh alloy which in turn gives rise to a higher exchange bias strength. Possible scenario for the exchange bias should have occurred from the boundaries between AFM/FM domains which could be due to the formation of AFM domain inside of FM matrix or vice versa in our single layer thin film. (C) 2019 Published by Elsevier B.V.