Poisson ratio and bulk lattice constant of (Sr0.25La0.75)CrO3 from strained epitaxial thin films

About 30 nm thick (001)-oriented (Sr0.25La0.75)CrO3 (SLCO) epitaxial thin films were grown by solid-source oxide molecular beam epitaxy on four different single-crystalline cubic or pseudocubic (001)-oriented oxide substrates, LaAlO3, (LaAlO3)(0.3)(Sr2AlTaO6)(0.7), SrTiO3, and DyScO3, which result in lattice mismatch ranging from -2% to +1.7%. All the films are of high-quality, flat, and strained by the substrates. By assessing the evolution of the out-of-plane lattice parameter as a function of the in-plane lattice parameter of the samples, we determine both the Poisson ratio (nu = 0.32) and the bulk lattice constant (a(b) = 3.876 angstrom) of SLCO. The Poisson ratio significantly differs from LaCrO3 (nu = 0.23), and the (SrxLa1-x)CrO3 solid solution appears to obey structural Vegard's law. Since SLCO is the only one p-type transparent conductive oxide of perovskite structure and has promising thermoelectric properties, integrating SLCO in heterostructures and devices is, therefore, of paramount importance, which confers on our results their strong interest. Besides, the method used here can be straightforwardly applied to other complex oxides. Published under license by AIP Publishing.