4.8 Article

TEM-Assisted Fabrication of Sub-10 nm Scanning Electrochemical Microscopy Tips

期刊

ANALYTICAL CHEMISTRY
卷 91, 期 24, 页码 15355-15359

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AMER CHEMICAL SOC
DOI: 10.1021/acs.analchem.9b04316

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资金

  1. National Science Foundation [CHE-1763337, CHE-1900401]
  2. U.S. DOE Office of Science Facility, at Brookhaven National Laboratory [DE-SC0012704]

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High-resolution scanning electrochemical microscopy (SECM) is a powerful technique for mapping surface topography and reactivity on the nanoscale and investigating heterogeneous processes at the level of single nanoparticles. The ability to fabricate ultrasmall nanoelectrode tips is critical for the progress in nano-SECM. Despite long-term efforts to improve previously developed procedures, the preparation and characterization of disk-type polished tips with the radius

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