4.6 Article

Ionization and Attachment Coefficients in C4F7N Gas Measured by the Steady-State Townsend Method

期刊

APPLIED SCIENCES-BASEL
卷 9, 期 18, 页码 -

出版社

MDPI
DOI: 10.3390/app9183686

关键词

C4F7N; ionization coefficient; attachment coefficient; critical electric field; steady-state Townsend method; ionization; plasma; gas discharge; high voltage; SF6

资金

  1. National Key R&D Program of China [2017YFB0902500]
  2. Science & Technology Project of State Grid Corporation of China

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The normalized Townsend first ionization coefficient alpha/N and normalized attachment coefficient eta/N in pure C4F7N were measured by using the steady-state Townsend (SST) method for a range of reduced electric fields E/N from 750 to 1150 Td at room temperature (20 degrees C). Meanwhile, the effective ionization coefficients are obtained. All SST experimental results show good agreement with pulsed Townsend (PT) experiment results. Comparisons of the critical electric fields of C4F7N with SF6 and other alternative gases such as c-C4F8 and CF3I indicate that C4F7N has a better insulation performance with a much higher normalized critical electric field at 959.19 Td.

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