期刊
SOLAR ENERGY MATERIALS AND SOLAR CELLS
卷 200, 期 -, 页码 -出版社
ELSEVIER
DOI: 10.1016/j.solmat.2019.110019
关键词
PV module degradation; Power loss analysis; PV reliability; Device modeling; Device characterization
资金
- U.S. Department of Energy via National Renewable Energy Laboratory [UGA-0-41029-1]
- U.S. Department of Energy PVRD program [DE-EE0007535]
- DOE-NSF ERF for Quantum Energy and Sustainable Solar Technologies (QESST)
Quantitative analysis of two 30-year-old PV modules is performed by a combination of the equivalent-circuit model and optoelectronic characterization methods. The two modules under analysis were manufactured in 1984 with the nameplate power of 41.0 W, but degraded under two different conditions; one was operated in the field in Northern California for about 30 years, and the other was stored in a warehouse for the same period. The power outputs of the two modules measured in 2016 are as 28.4W for the field-exposed one and 35.9 W for the warehoused one. We further break down this power difference of 7.5 W +/- 0.3 W to specific physical mechanisms. Through the encapsulant transmittance measurements and the circuit modeling of module I-V curves, the power degradation due to encapsulant discoloration is found as 59% +/- 4% of the total difference. With the bias-dependent electroluminescence imaging and the dark I-V measurement of solar cells (via the additionally-attached probe wires), the series-resistance increase is attributed to 33% +/- 1%, with the split of 13% +/- 4% due to interconnection resistance and 20% +/- 4% due to cell resistance. In addition, the synergistic effect of all the physical mechanisms makes up the remaining 8% +/- 4%. This case study presents an example of analyzing multiple degradation mechanisms of the PV modules. With more characterization data being collected for today's modules, the same analysis framework can be broadly applied, yield great insights module power degradation attributed to multiple loss mechanisms.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据