期刊
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS
卷 14, 期 2, 页码 -出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/pssr.201900406
关键词
band alignment; graphene; heterostructures; molybdenum disulfide; X-ray photoelectron spectroscopy
资金
- Russian Science Foundation [19-19-00504]
- Russian Science Foundation [19-19-00504] Funding Source: Russian Science Foundation
The band alignment in the graphene/MoS2 van der Waals heterostructures (vdWHs) is investigated by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) to understand the transfer- and annealing-induced change of electronic properties. Raman spectroscopy indicates that partial electron redistribution between the MoS2 and graphene layers occurs when brought into contact, resulting in a hole concentration decrease in graphene from 1 x 10(13) to 7 x 10(12) cm(-2). The additional thermal annealing at 400 degrees C further decreases the hole concentration down to 3 x 10(12) cm(-2) and leads to a MoS2 valence band offset increase by 0.2 eV. The annealing procedure also results in a visible decrease in adsorbed carbon- and oxygen-containing contaminants, and this decrease is clearly detected by XPS. Thus, the combination of Raman spectroscopy and XPS provides a powerful diagnostic tool for the electronic properties at each stage of vdWHs preparation, allowing the attainment of 2D vdWHs with the desired properties.
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